Create S-Parameters for Deembedding – BitWise Laboratories

 

In high-speed digital and RF design, accurate measurements are essential for understanding how interconnects, fixtures, and components behave under real operating conditions. At BitWise Laboratories, we help engineers achieve this precision by guiding them on how to create S-parameters for deembedding and apply them effectively. Deembedding removes the unwanted effects of test fixtures, probes, and adapters, giving you the true performance of your device under test (DUT).

When you create S-parameters for deembedding, the process typically starts with characterizing the measurement setup itself. This involves capturing the S-parameters of the fixture or test path using calibration standards such as through, open, short, and load structures. Engineers then build a deembedding model—often through network extraction or fixture removal algorithms—to mathematically subtract these parasitic effects from the final measurement. The result is a clean and reliable representation of the DUT, free from environmental distortions.



BitWise Laboratories supports this workflow with advanced measurement tools and expert testing methodologies. Our team ensures that generated S-parameters are accurate across the required frequency bandwidth and compatible with simulation tools like ADS, HFSS, and SPICE-based systems. We also help in validating deembedded data through time-domain reflectometry, eye diagram analysis, and correlation against simulation models.

Proper deembedding improves signal integrity, boosts design confidence, and reduces costly design iterations. Whether you are developing next-generation PCBs, validating connectors, or analyzing high-frequency materials, BitWise Laboratories provides the precision and support you need.

Partner with us to streamline your RF and high-speed design workflow with accurate S-parameter generation and world-class deembedding expertise.

For more visit us: https://bitwiselabs.com/

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