Create S-Parameters for Deembedding in High-Speed Measurements
Accurate characterization of high-speed devices requires removing the influence of fixtures, cables, and connectors from measurement results. These external elements can distort signals and mask the true behavior of the device under test. Deembedding techniques allow engineers to isolate the intrinsic electrical performance by mathematically subtracting known parasitic effects. This process is essential for precise modeling, simulation correlation, and compliance validation in advanced electronic designs. Create s-parameters for deembedding involves generating accurate network parameter data that represents the electrical behavior of test fixtures and interconnects. By measuring calibration standards or known structures, engineers obtain S-parameter files that can be used to remove unwanted contributions from measurement paths. This enables a clearer view of the device’s true frequency response, impedance characteristics, and signal integrity performance. Proper deembedding is p...