Create S-Parameters for Deembedding – BitWise Laboratories

 


At BitWise Laboratories, we empower engineers, RF designers, and high-speed PCB developers with advanced tools and services to create S-parameters for deembedding. In modern RF and microwave design, deembedding is crucial for accurate characterization of devices by removing the effects of test fixtures, connectors, and probes. Without proper deembedding, your S-parameter measurements may include unwanted artifacts that can compromise your simulation and modeling accuracy.

Our expert solutions allow you to generate precise, repeatable S-parameters that reflect the true behavior of your Device Under Test (DUT). Whether you're using vector network analyzers (VNAs) or time-domain reflectometry (TDR) setups, BitWise Laboratories offers streamlined workflows and software integration to make the deembedding process efficient and error-free.



We support both standard and custom calibration techniques, including TRL, SOLT, and multi-line TRL methods, to help you obtain clean S-parameters that are ready for direct use in simulation tools like ADS, HFSS, or CST. Our experienced engineers can assist with the entire process—from fixture modeling and port renormalization to S2P file generation—ensuring that your design validation is based on trusted data.

Clients across industries such as telecommunications, aerospace, automotive, and consumer electronics rely on us to optimize their signal integrity workflows. Whether you're testing high-speed SerDes links, antennas, or custom RF modules, we ensure your S-parameters are clean, calibrated, and ready for design insight.

Let BitWise Laboratories be your technical partner in precision deembedding. With our guidance, you’ll create S-parameters for deembedding that provide clarity, confidence, and competitive advantage in your product development cycle. Accurate measurements begin with accurate deembedding—and we make that possible.

 

For more information

Visit us : https://bitwiselabs.com/

 


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