S-Parameter Measurements with a TDR – BitWise Laboratories

 

S-parameter measurements with a TDR provide a highly effective approach for analyzing high-speed interconnects, PCBs, and RF components. Unlike traditional vector network analyzers (VNAs), a Time Domain Reflectometer (TDR) employs high-speed pulses and mathematical transformations to extract frequency-domain S-parameters with precision. This method enables detailed impedance profiling, return loss evaluation, and signal integrity analysis. BitWise Laboratories specializes in S-parameter measurements with a TDR, delivering accurate broadband frequency response analysis for engineers. By leveraging inverse Fourier transforms and de-embedding techniques, TDR systems offer a cost-effective and efficient alternative to conventional frequency-sweep measurements. Ideal for high-speed data links, RF circuits, and signal integrity testing, S-parameter measurements with a TDR ensure optimal design validation and performance.

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