Create S-Parameters for Deembedding – BitWise Laboratories

At BitWise Laboratories , we specialize in precision RF and microwave measurements, ensuring that every stage of your signal path is accurately characterized. One of the most critical steps in this process is to create S-parameters for deembedding, a technique used to remove the effects of test fixtures, connectors, and adapters from your device under test (DUT) measurements. When performing high-frequency measurements, the raw data you capture often includes unwanted contributions from the measurement setup. By applying a well-designed deembedding process, we can extract only the DUT’s true performance. To achieve this, we create S-parameters for deembedding that mathematically model the fixture or interconnects. These parameters are then applied to the measurement results to effectively subtract their influence, providing clean and accurate data. Our approach at BitWise Laboratories involves: Accurate Fixture Characterization – We begin by carefully measuring the test fixture ...